Shepherd Laboratories

Link to the CharFac's Shepherd Labs

Location: 100 Union Street Se, Minneapolis, MN, 55455

Building Abbrev: SHEPLAB, Building ID: 125

 

Proximal Nanoprobes (AFM & related)

Hysitron Triboindenter

The Triboindenter performs indentation tests by driving a diamond indenter into the specimen surface and dynamically collecting the applied force and displacement data.  Material properties are derived from the load and depth data.  Specimens are typically relatively smooth and flat.

Micromechanical Tester

MTS Nanoindenter XP

Scanning Probe Microscopy (SPM)

In scanning probe microscopy (SPM), commonly termed atomic force microscopy (AFM), the interaction of a stylus probe and sample surface is quantified and mapped across the sample.  The probe or "tip" is of nanometer-scale sharpness, and the standard image is 3D surface topography at a resolution approaching the atomic or molecular scale.  The tip is attached to a microfabricated cantilever of low spring constant.  Property-sensitive imaging modes are performed simultaneous to topographic imaging.  Gaseous or liquid media, plus sample temperature, can be controlled.  Tip chemistry can be modified for controlled studies of probe-sample interaction.

Tencor P‑10 Profilometer

 

Scanning and Transmission Electron Microscopy

JEOL 6500

High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence

Thermally-assisted field-emission gun

Accelerating voltage from 0.5 to 30 kV

Lateral resolution of 1.5 nm

Magnification ranges from 10 X to 400,000X

Sample size: 50 x 125 x 125 mm

Backscattered imaging at TV rates and low voltage using the Centaurus detector

Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system

Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system

Crystallographic analysis with an EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software

JEOL 6700

High resolution secondary electron imaging with both lower and "in-lens" SE detectors

Cold field-emission gun

"In-lens" design.  Sample size limit of ~ 5 mm W X 10 mm L X 2.5 mm H

Accelerating voltage from 0.5 to 30 kV

Lateral resolution of 1nm

Magnification ranges from 10 X to 700,000X

Sample size: 50 x 125 x 125 mm

FEI Tecnai G2 30

The Tecnai G2 F30 field emission gun transmission electron microscope combines all imaging, diffraction, and analytical techniques at high spatial resolution and detection efficiency.  The high-brightness, high-coherency gun allows large electron probe currents to be focused onto nanometer-sized areas of the specimen.

Application-specific modes include: High-resolution bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; STEM imaging; and hollow cone and high-angle annular dark-field imaging modes.

Accelerating voltage range of 50 to 300 kV.

Magnifications up to >1 million times.

Point resolution: 0.20 nm; Information limit: 0.14 nm; HAADF STEM resolution: 0.19 nm.

Maximum specimen tilt: 40°.

Drift rate: <1 nm / min.

Specimen holders: Single- and double-tilt holders; Protochips Aduro heating holder.

Energy-dispersive X-ray spectrometer: EDAX rTEM with an ultrathin window allows detection of elements from boron to uranium.

Electron energy loss spectrometer: Gatan Enfina spectrometer allows detection and chemical analysis of elements as light as lithium with an energy resolution of 0.35 eV (FWHM).

FEI Tecnai T12

The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.

Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts.

LaB6 source.

Accelerating voltage range of 20 to 120 kV.

Magnifications up to 700,000x.

Point resolution: 0.34 nm; Line resolution: 0.2 nm.

Maximum specimen tilt: 70°.

Drift rate: <1 nm / min.

Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders.

Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows detection of elements from beryllium to uranium.

 

Surface and Thin-Film Analysis

Auger Electron Spectroscopy – Physical Electronics Model 670

Ion Beam Analysis: Rutherford backscattering and related (PIXE, NRA/PIGE, FReS, channeling)

Microscopic Contact Angle Meter

Spectroscopic Ellipsometer – VASE

X-ray Photoelectron Spectroscopy (ESCA) – Physical Electronics Model 555

X-ray Photoelectron Spectroscopy (ESCA) – Surface Science SSX‑100

 

Vibrational Spectroscopy

Fourier Transform Infrared Spectrometer – Nicolet Magna‑IR 750

Confocal Raman Microscope

 

Visible Light Microscopy

Video and Computer-Enhanced Microscope – Nikon; Metamorph.

 

X-ray Diffraction & Scattering

-Wide Angle

Panalytical X'Pert Pro

Bruker AXS (Siemens) D5005

Bruker D8 Advance

-Small Angle

SAXS Ganesha

-Microdiffraction

Microdiffractometer – Bruker‑AXS

Diffractometer – Bruker D8 Discover 2D