Link to the CharFac's Shepherd Labs
Location: 100 Union Street Se, Minneapolis, MN, 55455
Building Abbrev: SHEPLAB, Building ID: 125
Proximal Nanoprobes (AFM & related)
Hysitron Triboindenter
The Triboindenter performs indentation tests by driving a diamond indenter into the specimen surface and dynamically collecting the applied force and displacement data. Material properties are derived from the load and depth data. Specimens are typically relatively smooth and flat.
Micromechanical Tester
MTS Nanoindenter XP
Scanning Probe Microscopy (SPM)
In scanning probe microscopy (SPM), commonly termed atomic force microscopy (AFM), the interaction of a stylus probe and sample surface is quantified and mapped across the sample. The probe or "tip" is of nanometer-scale sharpness, and the standard image is 3D surface topography at a resolution approaching the atomic or molecular scale. The tip is attached to a microfabricated cantilever of low spring constant. Property-sensitive imaging modes are performed simultaneous to topographic imaging. Gaseous or liquid media, plus sample temperature, can be controlled. Tip chemistry can be modified for controlled studies of probe-sample interaction.
Tencor P‑10 Profilometer
Scanning and Transmission Electron Microscopy
JEOL 6500
High resolution secondary electron imaging; backscatter electron imaging; energy dispersive spectroscopy; electron backscatter diffraction; and cathodoluminescence
Thermally-assisted field-emission gun
Accelerating voltage from 0.5 to 30 kV
Lateral resolution of 1.5 nm
Magnification ranges from 10 X to 400,000X
Sample size: 50 x 125 x 125 mm
Backscattered imaging at TV rates and low voltage using the Centaurus detector
Chemical analysis of bulk samples with elements as low as sodium available using a Thermo-Noran Vantage system
Cathodoluminescence analysis with a Gatan (Oxford) MonoCL 2 system
Crystallographic analysis with an EBSD system from HKL allowing pattern indexing and texture mapping with Channel 5 software
JEOL 6700
High resolution secondary electron imaging with both lower and "in-lens" SE detectors
Cold field-emission gun
"In-lens" design. Sample size limit of ~ 5 mm W X 10 mm L X 2.5 mm H
Accelerating voltage from 0.5 to 30 kV
Lateral resolution of 1nm
Magnification ranges from 10 X to 700,000X
Sample size: 50 x 125 x 125 mm
FEI Tecnai G2 30
The Tecnai G2 F30 field emission gun transmission electron microscope combines all imaging, diffraction, and analytical techniques at high spatial resolution and detection efficiency. The high-brightness, high-coherency gun allows large electron probe currents to be focused onto nanometer-sized areas of the specimen.
Application-specific modes include: High-resolution bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; STEM imaging; and hollow cone and high-angle annular dark-field imaging modes.
Accelerating voltage range of 50 to 300 kV.
Magnifications up to >1 million times.
Point resolution: 0.20 nm; Information limit: 0.14 nm; HAADF STEM resolution: 0.19 nm.
Maximum specimen tilt: 40°.
Drift rate: <1 nm / min.
Specimen holders: Single- and double-tilt holders; Protochips Aduro heating holder.
Energy-dispersive X-ray spectrometer: EDAX rTEM with an ultrathin window allows detection of elements from boron to uranium.
Electron energy loss spectrometer: Gatan Enfina spectrometer allows detection and chemical analysis of elements as light as lithium with an energy resolution of 0.35 eV (FWHM).
FEI Tecnai T12
The Tecnai T12 microscope combines all imaging, diffraction, and analytical techniques at good spatial resolution and detection efficiency.
Application-specific modes include: Bright- and dark-field imaging; TEM microprobe and nanoprobe analysis; small-probe convergent beam; and large specimen tilts.
LaB6 source.
Accelerating voltage range of 20 to 120 kV.
Magnifications up to 700,000x.
Point resolution: 0.34 nm; Line resolution: 0.2 nm.
Maximum specimen tilt: 70°.
Drift rate: <1 nm / min.
Specimen holders: Single tilt; double tilt; tilt–rotate; double-tilt cooling; single- and double-tilt heating; low-background single-tilt EDX; and straining/indenting mechanical holders.
Energy-dispersive X-ray spectrometer: Oxford Inca system with an ultrathin window allows detection of elements from beryllium to uranium.